The Wassenaar Arrangement - Dual-Use and Munitions Lists - July 1996
[79]
6.A. SYSTEMS, EQUIPMENT AND COMPONENTS
6.A.1. Acoustics:
a. Marine acoustic systems, equipment and specially designed components therefor, as follows:1. Active (transmitting or transmitting-and-receiving) systems, equipment and specially designed components therefor, as follows:Note 6.A.1.a.1. does not control:a. Depth sounders operating vertically below the apparatus, not including a scanning function exceeding ± 20°, and limited to measuring the depth of water, the distance of submerged or buried objects or fish finding;
b. Acoustic beacons, as follows:
1. Acoustic emergency beacons;2. Pingers specially designed for relocating or returning to an underwater position.
a. Wide-swath bathymetric survey systems designed for sea bed topographic mapping, having all of the following:
1. Being designed to take measurements at an angle exceeding 20° from the vertical;2. Being designed to measure depths exceeding 600 m below the water surface; and
3. Being designed to provide any of the following:
a. Incorporation of multiple beams any of which is less than 1.9°; orb. Data accuracies of better than 0.3% of water depth across the swath averaged over the individual measurements within the swath;
b. Object detection or location systems having any of the following:
1. A transmitting frequency below 10 kHz;2. Sound pressure level exceeding 224 dB (reference 1 µPa at 1 m) for equipment with an operating frequency in the band from 10 kHz to 24 kHz inclusive;
3. Sound pressure level exceeding 235 dB (reference 1 µPa at 1 m) for equipment with an operating frequency in the band between 24 kHz and 30 kHz;
4. Forming beams of less than 1° on any axis and having an operating frequency of less than 100 kHz;
5. Designed to operate with an unambiguous display range exceeding 5,120 m; or
[80]
6.A.1.a.1.b.
6. Designed to withstand pressure during normal operation at depths exceeding 1,000 m and having transducers with any of the following:a. Dynamic compensation for pressure; orb. Incorporating other than lead zirconate titanate as the transduction element;
6.A.1.a.1.
c. Acoustic projectors, including transducers, incorporating piezoelectric, magnetostrictive, electrostrictive, electrodynamic or hydraulic elements operating individually or in a designed combination, having any of the following:Note 1 The control status of acoustic projectors, including transducers, specially designed for other equipment is determined by the control status of the other equipment.Note 2 6.A.1.a.1.c. does not control electronic sources which direct the sound vertically only, or mechanical (e.g., air gun or vapour-shock gun) or chemical (e.g., explosive) sources.
1. An instantaneous radiated acoustic power density exceeding 0.01 mW/mm2/Hz for devices operating at frequencies below 10 kHz;2. A continuously radiated acoustic power density exceeding 0.001 mW/mm2/Hz for devices operating at frequencies below 10 kHz;
Technical NoteAcoustic power density is obtained by dividing the output acoustic power by the product of the area of the radiating surface and the frequency of operation.
3. Designed to withstand pressure during normal operation at depths exceeding 1,000 m; or
4. Side-lobe suppression exceeding 22 dB;
d. Acoustic systems, equipment and specially designed components for determining the position of surface vessels or underwater vehicles having any of the following:
Note: 6.A.1.a.1.d. includes:a. Equipment using coherent "signal processing" between two or more beacons and the hydrophone unit carried by the surface vessel or underwater vehicle;b.. Equipment capable of automatically correcting speed-of-sound propagation errors for calculation of a point.
[81]
6.A.1.a.1.d.
1. Designed to operate at a range exceeding 1,000 m with a positioning accuracy of less than 10 m rms (root mean square) when measured at a range of 1,000 m; or2. Designed to withstand pressure at depths exceeding 1,000 m;
6.A.1.a.
2. Passive (receiving, whether or not related in normal application to separate active equipment) systems, equipment and specially designed components therefor, as follows:a. Hydrophones (transducers) having any of the following characteristics:1. Incorporating continuous flexible sensors or assemblies of discrete sensor elements with either a diameter or length less than 20 mm and with a separation between elements of less than 20 mm;2. Having any of the following sensing elements:
a. Optical fibres;b. Piezoelectric polymers; or
c. Flexible piezoelectric ceramic materials;
3. A hydrophone sensitivity better than -180 dB at any depth with no acceleration compensation;
4. When designed to operate at depths not exceeding 35 m, a hydrophone sensitivity better than - 186 dB with acceleration compensation;
5. When designed for normal operation at depths exceeding 35 m, a hydrophone sensitivity better than -192 dB with acceleration compensation;
6. When designed for normal operation at depths exceeding 100 m, a hydrophone sensitivity better than -204 dB; or
7. Designed for operation at depths exceeding 1,000 m;
Technical Note
Hydrophone sensitivity is defined as twenty times the logarithm to the base 10 of the ratio of rms output voltage to a 1 V rms reference, when the hydrophone sensor, without a pre-amplifier, is placed in a plane wave acoustic field with an rms pressure of 1 µPa. For example, a hydrophone of -160 dB (reference 1 V per µPa) would yield an output voltage of 10-8 V in such a field, while one of -180 dB sensitivity would yield only 10-9 V output. Thus, -160 dB is better than -180 dB.
[82]
6.A.1.a.2.
b. Towed acoustic hydrophone arrays having any of the following:1. Hydrophone group spacing of less than 12.5 m;2. Hydrophone group spacing of 12.5 m to less than 25 m and designed or able to be modified to operate at depths exceeding 35 m;
Technical Note:'Able to be modified' in 6.A.1.a.2.b.2. means having provisions to allow a change of the wiring or interconnections to alter hydrophone group spacing or operating depth limits. These provisions are: spare wiring exceeding 10% of the number of wires, hydrophone group spacing adjustment blocks or internal depth limiting devices that are adjustable or that control more than one hydrophone group.
3. Hydrophone group spacing of 25 m or more and designed to operate at depths exceeding 100 m;
4. Heading sensors specified in 6.A.1.a.2.d.;
5. Longitudinally reinforced array hoses;
6. An assembled array of less than 40 mm in diameter;
7. Multiplexed hydrophone group signals designed to operate at depths exceeding 35 m or having an adjustable or removable depth sensing device in order to operate at depths exceeding 35 m; or
8. Hydrophone characteristics specified in 6.A.1.a.2.a.;
c. Processing equipment, specially designed for towed acoustic hydrophone arrays, having "user accessible programmability" and time or frequency domain processing and correlation, including spectral analysis, digital filtering and beamforming using Fast Fourier or other transforms or processes;
d. Heading sensors having all of the following:
1. An accuracy of better than ± 0.5°; and2. Any of the following:
a. Designed to be incorporated within the array hosing and to operate at depths exceeding 35 m or having an adjustable or removable depth sensing device in order to operate at depths exceeding 35 m; orb. Designed to be mounted external to the array hosing and having a sensor unit capable of operating with 360° roll at depths exceeding 35 m;
[83]
6.A.1.a.2.
e. Bottom or bay cable systems having any of the following:1. Incorporating hydrophones specified in 6.A.1.a.2.a.;2. Incorporating multiplexed hydrophone group signals designed to operate at depths exceeding 35 m or having an adjustable or removable depth sensing device in order to operate at depths exceeding 35 m; or
3. Processing equipment, specially designed for bottom or bay cable systems, having "user accessible programmability" and time or frequency domain processing and correlation, including spectral analysis, digital filtering and beamforming using Fast Fourier or other transforms or processes;
6.A.1.
b. Correlation-velocity sonar log equipment designed to measure the horizontal speed of the equipment carrier relative to the sea bed at distances between the carrier and the sea bed exceeding 500 m.
6.A.2. OPTICAL SENSORS
a. Optical detectors, as follows:Note 6.A.2.a. does not control germanium or silicon photodevices.1. "Space-qualified" solid-state detectors, as follows:a. "Space-qualified" solid-state detectors, having all of the following:1. A peak response in the wavelength range exceeding 10 nm but not exceeding 300 nm; and2. A response of less than 0.1% relative to the peak response at a wavelength exceeding 400 nm;
b. "Space-qualified" solid-state detectors, having all of the following:
1. A peak response in the wavelength range exceeding 900 nm but not exceeding 1,200 nm; and2. A response "time constant" of 95 ns or less;
c. "Space-qualified" solid-state detectors having a peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm;
2. Image intensifier tubes and specially designed components therefor, as follows:
a. Image intensifier tubes having all of the following:1. A peak response in the wavelength range exceeding 400 nm but not exceeding 1,050 nm;2. A microchannel plate for electron image amplification with a hole pitch (centre-to-centre spacing) of 15 µm or less; and
[84]
6.A.2.a.2.a.
3. Photocathodes, as follows:a. S-20, S-25 or multialkali photocathodes with a luminous sensitivity exceeding 240 µA/lm;b. GaAs or GaInAs photocathodes; or
c. Other III-V compound semiconductor photocathodes;
Note 6.A.2.a.2.a.3.c. does not control compound semiconductor photocathodes with a maximum radiant sensitivity of 10 mA/W or less.
6.A.2.a.2.
b. Specially designed components, as follows:1. Microchannel plates having a hole pitch (centre-to-centre spacing) of 15 µm or less;2. GaAs or GaInAs photocathodes;
3. Other III-V compound semiconductor photocathodes;
Note 6.A.2.a.2.b.3. does not control compound semiconductor photocathodes with a maximum radiant sensitivity of 10 mA/W or less.
6.A.2.a.
3. Non-"space-qualified" "focal plane arrays", as follows:Technical NoteLinear or two-dimensional multi-element detector arrays are referred to as "focal plane arrays".
Note 1 6.A.2.a.3. includes photoconductive arrays and photovoltaic arrays.Note 2 6.A.2.a.3. does not control silicon "focal plane arrays", multi-element (not to exceed 16 elements) encapsulated photoconductive cells or pyroelectric detectors using any of the following:
a. Lead sulphide;b. Triglycine sulphate and variants;
c. Lead-lanthanum-zirconium titanate and variants;
d. Lithium tantalate;
e. Polyvinylidene fluoride and variants;
f. Strontium barium niobate and variants; or
g. Lead selenide.
a. Non-"space-qualified" "focal plane arrays", having all of the following:1. Individual elements with a peak response within the wavelength range exceeding 900 nm but not exceeding 1,050 nm; and2. A response "time constant" of less than 0.5 ns;
[85]
6.A.2.a.3.
b. Non-"space-qualified" "focal plane arrays", having all of the following:1. Individual elements with a peak response in the wavelength range exceeding 1,050 nm but not exceeding 1,200 nm; and2. A response "time constant" of 95 ns or less;
c. Non-"space-qualified" "focal plane arrays", having individual elements with a peak response in the wavelength range exceeding 1,200 nm but not exceeding 30,000 nm.
6.A.2.
b. "Monospectral imaging sensors" and "multispectral imaging sensors" designed for remote sensing applications, having any of the following:1. An Instantaneous-Field-Of-View (IFOV) of less than 200 µr (microradians); or2. Being specified for operation in the wavelength range exceeding 400 nm but not exceeding 30,000 nm and having all the following;
a. Providing output imaging data in digital format; andb. Being any of the following:
1. "Space-qualified"; or2. Designed for airborne operation, using other than silicon detectors, and having an IFOV of less than 2.5 mrad (milliradians).
c. Direct view imaging equipment operating in the visible or infrared spectrum, incorporating any of the following:
1. Image intensifier tubes specified in 6.A.2.a.2.a. ; or2. "Focal plane arrays" specified in 6.A.2.a.3.
Technical Note
'Direct view' refers to imaging equipment, operating in the visible or infrared spectrum, that presents a visual image to a human observer without converting the image into an electronic signal for television display, and that cannot record or store the image photographically, electronically or by any other means.
Note 6.A.2.c. does not control the following equipment incorporating other than GaAs or GaInAs photocathodes:
a. Industrial or civilian intrusion alarm, traffic or industrial movement control or counting systems;b. Medical equipment;
c. Industrial equipment used for inspection, sorting or analysis of the properties of materials;
d. Flame detectors for industrial furnaces;
e. Equipment specially designed for laboratory use.
[86]
6.A.2.
d. Special support components for optical sensors, as follows:1. "Space-qualified" cryocoolers;2. Non-"space-qualified" cryocoolers, having a cooling source temperature below 218 K (-55°C), as follows:
a. Closed cycle type with a specified Mean-Time-To-Failure (MTTF), or Mean-Time-Between-Failures (MTBF), exceeding 2,500 hours;b. Joule-Thomson (JT) self-regulating minicoolers having bore (outside) diameters of less than 8 mm;
3. Optical sensing fibres specially fabricated either compositionally or structurally, or modified by coating, to be acoustically, thermally, inertially, electromagnetically or nuclear radiation sensitive.
e. "Space qualified" "focal plane arrays" having more than 2,048 elements per array and having a peak response in the wavelength range exceeding 300 nm but not exceeding 900 nm.
6.A.3. CAMERAS
N.B. For cameras specially designed or modified for underwater use, see 8.A.2.d. and 8.A.2.e.a. Instrumentation cameras, as follows:
1. High-speed cinema recording cameras using any film format from 8 mm to 16 mm inclusive, in which the film is continuously advanced throughout the recording period, and that are capable of recording at framing rates exceeding 13,150 frames/s;Note 6.A.3.a.1. does not control cinema recording cameras for normal civil purposes.2. Mechanical high speed cameras, in which the film does not move, capable of recording at rates exceeding 1,000,000 frames/s for the full framing height of 35 mm film, or at proportionately higher rates for lesser frame heights, or at proportionately lower rates for greater frame heights;
3. Mechanical or electronic streak cameras having writing speeds exceeding 10 mm/s;
4. Electronic framing cameras having a speed exceeding 1,000,000 frames/µs;
5. Electronic cameras, having all of the following:
a. An electronic shutter speed (gating capability) of less than 1 µs per full frame; andb. A read out time allowing a framing rate of more than 125 full frames per second.
[87]
6.A.3.
b. Imaging cameras, as follows:Note 6.A.3.b. does not control television or video cameras specially designed for television broadcasting.1. Video cameras incorporating solid state sensors, having any of the following:a. More than 4 x 106 "active pixels" per solid state array for monochrome (black and white) cameras;b. More than 4 x 106 "active pixels" per solid state array for colour cameras incorporating three solid state arrays; or
c. More than 12 x 106 "active pixels" for solid state array colour cameras incorporating one solid state array;
2. Scanning cameras and scanning camera systems, having all of the following:
a. Linear detector arrays with more than 8,192 elements per array; andb. Mechanical scanning in one direction;
3. Imaging cameras incorporating image intensifiers specified in 6.A.2.a.2.a.;
4. Imaging cameras incorporating "focal plane arrays" specified in 6.A.2.a.3.
6.A.4. OPTICS
a. Optical mirrors (reflectors), as follows:1. "Deformable mirrors" having either continuous or multi-element surfaces, and specially designed components therefor, capable of dynamically repositioning portions of the surface of the mirror at rates exceeding 100 Hz;2. Lightweight monolithic mirrors having an average "equivalent density" of less than 30 kg/m2 and a total mass exceeding 10 kg;
3. Lightweight "composite" or foam mirror structures having an average "equivalent density" of less than 30 kg/m2 and a total mass exceeding 2 kg;
4. Beam steering mirrors more than 100 mm in diameter or length of major axis, which maintain a flatness of lambda/2 or better (lambda is equal to 633 nm) having a control bandwidth exceeding 100 Hz.
[88]
6.A.4.
b. Optical components made from zinc selenide (ZnSe) or zinc sulphide (ZnS) with transmission in the wavelength range exceeding 3,000 nm but not exceeding 25,000 nm and having any of the following:1. Exceeding 100 cm3 in volume; or2. Exceeding 80 mm in diameter or length of major axis and 20 mm in thickness (depth).
c. "Space-qualified" components for optical systems, as follows:
1. Lightweighted to less than 20% "equivalent density" compared with a solid blank of the same aperture and thickness;2. Substrates, substrates having surface coatings (single-layer or multi-layer, metallic or dielectric, conducting, semiconducting or insulating) or having protective films;
3. Segments or assemblies of mirrors designed to be assembled in space into an optical system with a collecting aperture equivalent to or larger than a single optic 1 m in diameter;
4. Manufactured from "composite" materials having a coefficient of linear thermal expansion equal to or less than 5 x 10-6 in any coordinate direction.
d. Optical control equipment, as follows:
1. Specially designed to maintain the surface figure or orientation of the "space-qualified" components specified in 6.A.4.c.1. or 6.A.4.c.3.;2. Having steering, tracking, stabilisation or resonator alignment bandwidths equal to or more than 100 Hz and an accuracy of 10 µrad (microradians) or less;
3. Gimbals having all of the following:
a. A maximum slew exceeding 5°;b. A bandwidth of 100 Hz or more;
c. Angular pointing errors of 200 rad (microradians) or less; and
d. Having any of the following:
1. Exceeding 0.15 m but not exceeding 1 m in diameter or major axis length and capable of angular accelerations exceeding 2 rad (radians)/s2; or2. Exceeding 1 m in diameter or major axis length and capable of angular accelerations exceeding 0.5 rad (radians)/s2;
4. Specially designed to maintain the alignment of phased array or phased segment mirror systems consisting of mirrors with a segment diameter or major axis length of 1 m or more.
[89]
6.A.5. LASERS
"Lasers", components and optical equipment, as follows:
Note 1 Pulsed "lasers" include those that run in a continuous wave (CW) mode with pulses superimposed.Note 2 Pulse-excited "lasers" include those that run in a continuously excited mode with pulse excitation superimposed.
Note 3 The control status of Raman "lasers" is determined by the parameters of the pumping source "lasers". The pumping source "lasers" can be any of the "lasers" described below.
a. Gas "lasers", as follows:1. Excimer "lasers", having any of the following:a. An output wavelength not exceeding 150 nm and having any of the following:1. An output energy exceeding 50 mJ per pulse; or2. An average or CW output power exceeding 1 W;
b. An output wavelength exceeding 150 nm but not exceeding 190 nm and having any of the following:
1. An output energy exceeding 1.5 J per pulse; or2. An average or CW output power exceeding 120 W;
c. An output wavelength exceeding 190 nm but not exceeding 360 nm and having any of the following:
1. An output energy exceeding 10 J per pulse; or2. An average or CW output power exceeding 500 W; or
d. An output wavelength exceeding 360 nm and having any of the following:
1. An output energy exceeding 1.5 J per pulse; or2. An average or CW output power exceeding 30 W;
2. Metal vapour "lasers", as follows:
a. Copper (Cu) "lasers" having an average or CW output power exceeding 20 W;b. Gold (Au) "lasers" having an average or CW output power exceeding 5 W;
c. Sodium (Na) "lasers" having an output power exceeding 5 W;
d. Barium (Ba) "lasers" having an average or CW output power exceeding 2 W;
3. Carbon monoxide (CO) "lasers" having any of the following:
a. An output energy exceeding 2 J per pulse and a pulsed "peak power" exceeding 5 kW; orb. An average or CW output power exceeding 5 kW;
[90]
6.A.5.a.
4. Carbon dioxide (CO2) "lasers" having any of the following:a. A CW output power exceeding 15 kW;b. A pulsed output having a "pulse duration" exceeding 10 s and having any of the following:
1. An average output power exceeding 10 kW; or2. A pulsed "peak power" exceeding 100 kW; or
c. A pulsed output having a "pulse duration" equal to or less than 10 s; and having any of the following:
1. A pulse energy exceeding 5 J per pulse; or2. An average output power exceeding 2.5 kW;
5. "Chemical lasers", as follows:
a. Hydrogen Fluoride (HF) "lasers";b. Deuterium Fluoride (DF) "lasers";
c. "Transfer lasers", as follows:
1. Oxygen Iodine (O2-I) "lasers";2. Deuterium Fluoride-Carbon dioxide (DF-CO2) "lasers";
6. Gas discharge and ion "lasers" (i.e., krypton ion or argon ion "lasers") having any of the following:
a. An output energy exceeding 1.5 J per pulse and a pulsed "peak power" exceeding 50 W; orb. An average or CW output power exceeding 50 W;
7. Other gas "lasers", having any of the following:
Note 6.A.5.a.7. does not control nitrogen "lasers".a. An output wavelength not exceeding 150 nm and having any of the following:1. An output energy exceeding 50 mJ per pulse and a pulsed "peak power" exceeding 1 W; or2. An average or CW output power exceeding 1 W;
b. An output wavelength exceeding 150 nm but not exceeding 800 nm and having any of the following:
1. An output energy exceeding 1.5 J per pulse and a pulsed "peak power" exceeding 30 W; or2. An average or CW output power exceeding 30 W;
c. An output wavelength exceeding 800 nm but not exceeding 1,400 nm and having any of the following:
1. An output energy exceeding 0.25 J per pulse and a pulsed "peak power" exceeding 10 W; or2. An average or CW output power exceeding 10 W; or
d. An output wavelength exceeding 1,400 nm and an average or CW output power exceeding 1 W.
[91]
6.A.5.
b. Individual, multiple-transverse mode semiconductor "lasers" and arrays of individual semiconductor "lasers", having any of the following:1. An output energy exceeding 500 µJ per pulse and a pulsed "peak power" exceeding 10 W; or2. An average or CW output power exceeding 10 W.
Technical Note
Semiconductor "lasers" are commonly called "laser" diodes.
Note 1 6.A.5.b. includes semiconductor "lasers" having optical output connectors (e.g. fibre optic pigtails).Note 2 The control status of semiconductor "lasers" specially designed for other equipment is determined by the control status of the other equipment.
c. Solid state "lasers", as follows:
1. "Tunable" "lasers" having any of the following:Note 6.A.5.c.1. includes titanium - sapphire(Ti: Al2O3), thulium - YAG (Tm: YAG), thulium - YSGG (Tm: YSGG), alexandrite (Cr: BeAl2O4) and colour centre "lasers".a. An output wavelength less than 600 nm and having any of the following:
1. An output energy exceeding 50 mJ per pulse and a pulsed "peak power" exceeding 1 W; or2. An average or CW output power exceeding 1 W;
b. An output wavelength of 600 nm or more but not exceeding 1,400 nm and having any of the following:
1. An output energy exceeding 1 J per pulse and a pulsed "peak power" exceeding 20 W; or2. An average or CW output power exceeding 20 W; or
c. An output wavelength exceeding 1,400 nm and having any of the following:
1. An output energy exceeding 50 mJ per pulse and a pulsed "peak power" exceeding 1 W; or2. An average or CW output power exceeding 1 W;
[92]
6.A.5.c.
2. Non-"tunable" "lasers", as follows:Note 6.A.5.c.2. includes atomic transition solid state "lasers".a. Neodymium glass "lasers", as follows:1. "Q-switched lasers" having any of the following:a. An output energy exceeding 20 J but not exceeding 50 J per pulse and an average output power exceeding 10 W; orb. An output energy exceeding 50 J per pulse;
2. Non-"Q-switched lasers" having any of the following:
a. An output energy exceeding 50 J but not exceeding 100 J per pulse and an average output power exceeding 20 W; orb. An output energy exceeding 100 J per pulse;
b. Neodymium-doped (other than glass) "lasers", having an output wavelength exceeding 1,000 nm but not exceeding 1,100 nm, as follows:
N.B. For neodymium-doped (other than glass) "lasers" having an output wavelength not exceeding 1,000 nm or exceeding 1,100 nm, see 6.A.5.c.2.c.
1. Pulse-excited, mode-locked, "Q-switched lasers" having a "pulse duration" of less than 1 ns and having any of the following:a. A "peak power" exceeding 5 GW;b. An average output power exceeding 10 W; or
c. A pulsed energy exceeding 0.1 J;
2. Pulse-excited, "Q-switched lasers" having a pulse duration equal to or more than 1 ns, and having any of the following:
a. A single-transverse mode output having:1. A "peak power" exceeding 100 MW;2. An average output power exceeding 20 W; or
3. A pulsed energy exceeding 2 J; or
b. A multiple-transverse mode output having:
1. A "peak power" exceeding 400 MW;2. An average output power exceeding 2 kW; or
3. A pulsed energy exceeding 2 J;
[93]
6.A.5.c.2.b.
3. Pulse-excited, non-"Q-switched lasers", having:a. A single-transverse mode output having:1. A "peak power" exceeding 500 kW; or2. An average output power exceeding 150 W; or
b. A multiple-transverse mode output having:
1. A "peak power" exceeding 1 MW; or2. An average power exceeding 2 kW;
4. Continuously excited "lasers" having:
a. A single-transverse mode output having:1. A "peak power" exceeding 500 kW; or2. An average or CW output power exceeding 150 W; or
b. A multiple-transverse mode output having:
1. A "peak power" exceeding 1 MW; or2. An average or CW output power exceeding 2 kW;
6.A.5.c.2.
c. Other non-"tunable" "lasers", having any of the following:1. A wavelength less than 150 nm and having any of the following:a. An output energy exceeding 50 mJ per pulse and a pulsed "peak power" exceeding 1 W; orb. An average or CW output power exceeding 1 W;
2. A wavelength of 150 nm or more but not exceeding 800 nm and having any of the following:
a. An output energy exceeding 1.5 J per pulse and a pulsed "peak power" exceeding 30 W; orb. An average or CW output power exceeding 30 W;
3. A wavelength exceeding 800 nm but not exceeding 1,400 nm, as follows:
a. "Q-switched lasers" having:1. An output energy exceeding 0.5 J per pulse and a pulsed "peak power" exceeding 50 W; or2. An average output power exceeding:
a. 10 W for single-mode "lasers";b. 30 W for multimode "lasers";
b. Non-"Q-switched lasers" having:
1. An output energy exceeding 2 J per pulse and a pulsed "peak power" exceeding 50 W; or2. An average or CW output power exceeding 50 W; or
[94]
6.A.5.c.2.c.
4. A wavelength exceeding 1,400 nm and having any of the following:a. An output energy exceeding 100 mJ per pulse and a pulsed "peak power" exceeding 1 W; orb. An average or CW output power exceeding 1 W;
6.A.5.
d. Dye and other liquid "lasers", having any of the following:1. A wavelength less than 150 nm and:a. An output energy exceeding 50 mJ per pulse and a pulsed "peak power" exceeding 1 W; orb. An average or CW output power exceeding 1 W;
2. A wavelength of 150 nm or more but not exceeding 800 nm and having any of the following:
a. An output energy exceeding 1.5 J per pulse and a pulsed "peak power" exceeding 20 W;b. An average or CW output power exceeding 20 W; or
c. A pulsed single longitudinal mode oscillator having an average output power exceeding 1 W and a repetition rate exceeding 1 kHz if the "pulse duration" is less than 100 ns;
3. A wavelength exceeding 800 nm but not exceeding 1,400 nm and having any of the following:
a. An output energy exceeding 0.5 J per pulse and a pulsed "peak power" exceeding 10 W; orb. An average or CW output power exceeding 10 W; or
4. A wavelength exceeding 1,400 nm and having any of the following:
a. An output energy exceeding 100 mJ per pulse and a pulsed "peak power" exceeding 1 W; orb. An average or CW output power exceeding 1 W;
e. Components, as follows:
1. Mirrors cooled either by active cooling or by heat pipe cooling;Technical NoteActive cooling is a cooling technique for optical components using flowing fluids within the subsurface (nominally less than 1 mm below the optical surface) of the optical component to remove heat from the optic.
2. Optical mirrors or transmissive or partially transmissive optical or electro-optical components specially designed for use with controlled "lasers";
[95]
6.A.5.
f. Optical equipment, as follows:(For shared aperture optical elements, capable of operating in "Super-High Power Laser" ("SHPL") applications, see Item 23. Note 2.d. on the Munitions List.)*1. Dynamic wavefront (phase) measuring equipment capable of mapping at least 50 positions on a beam wavefront having any of the following:a. Frame rates equal to or more than 100 Hz and phase discrimination of at least 5% of the beam's wavelength; orb. Frame rates equal to or more than 1,000 Hz and phase discrimination of at least 20% of the beam's wavelength;
2. "Laser" diagnostic equipment capable of measuring "SHPL" system angular beam steering errors of equal to or less than 10 rad;
3. Optical equipment and components specially designed for a phased-array "SHPL" system for coherent beam combination to an accuracy of lambda/10 at the designed wavelength, or 0.1 µm, whichever is the smaller;
4. Projection telescopes specially designed for use with "SHPL" systems.
6.A.6. MAGNETOMETERS
"Magnetometers", "magnetic gradiometers", "intrinsic magnetic gradiometers" and compensation systems, and specially designed components therefor, as follows:
Note 6.A.6 does not control instruments specially designed for biomagnetic measurements for medical diagnostics.
a. "Magnetometers" using "superconductive", optically pumped or nuclear precession (proton/Overhauser) "technology" having a "noise level" (sensitivity) lower (better) than 0.05 nT rms per square root Hz;b. Induction coil "magnetometers" having a "noise level" (sensitivity) lower (better) than any of the following:
1. 0.05 nT rms/square root Hz at frequencies of less than 1 Hz;2. 1 x 10-3 nT rms/square root Hz at frequencies of 1 Hz or more but not exceeding 10 Hz; or
3. 1 x 10-4 nT rms/square root Hz at frequencies exceeding 10 Hz;
c. Fibre optic "magnetometers" having a "noise level" (sensitivity) lower (better) than 1 nT rms per square root Hz;
d. "Magnetic gradiometers" using multiple "magnetometers" specified in 6.A.6.a., 6.A.6.b. or 6.A.6.c.;
_________________
* France and the Russian Federation view this list as reference drawn up to help in the selection of dual-use goods which could contribute to the indigenous development, production or enhancement of conventional munitions capabilities.
[96]
6.A.6.
e. Fibre optic "intrinsic magnetic gradiometers" having a magnetic gradient field "noise level" (sensitivity) lower (better) than 0.3 nT/m rms per square root Hz;f. "Intrinsic magnetic gradiometers", using "technology" other than fibre-optic "technology", having a magnetic gradient field "noise level" (sensitivity) lower (better) than 0.015 nT/m rms per square root Hz;
g. Magnetic compensation systems for magnetic sensors designed for operation on mobile platforms;
h. "Superconductive" electromagnetic sensors, containing components manufactured from "superconductive" materials:
1. Designed for operation at temperatures below the "critical temperature" of at least one of their "superconductive" constituents (including Josephson effect devices or "superconductive" quantum interference devices (SQUIDS));2. Designed for sensing electromagnetic field variations at frequencies of 1 kHz or less; and:
3. Having any of the following characteristics:
a. Incorporating thin-film SQUIDS with a minimum feature size of less than 2 µm and with associated input and output coupling circuits;b. Designed to operate with a magnetic field slew rate exceeding 1 x 106 magnetic flux quanta per second;
c. Designed to function without magnetic shielding in the earth's ambient magnetic field; or
d. Having a temperature coefficient less (smaller) than 0.1 magnetic flux quantum/K.
6.A.7. GRAVIMETERS
Gravity meters (gravimeters) and gravity gradiometers, as follows:
a. Gravity meters for ground use having a static accuracy of less (better) than 10 µgal;Note 6.A.7.a. does not control ground gravity meters of the quartz element (Worden) type.b. Gravity meters for mobile platforms for ground, marine, submersible, space or airborne use, having all of the following:
1. A static accuracy of less (better) than 0.7 mgal; and2. An in-service (operational) accuracy of less (better) than 0.7 mgal having a time-to-steady-state registration of less than 2 minutes under any combination of attendant corrective compensations and motional influences;
c. Gravity gradiometers.
[97]
6.A.8. RADAR
Radar systems, equipment and assemblies having any of the following characteristics, and specially designed components therefor:
Note 6.A.8. does not control:a. Secondary surveillance radar (SSR);b. Car radar designed for collision prevention;
c. Displays or monitors used for air traffic control (ATC) having no more than 12 resolvable elements per mm;
d. Meteorological (weather) radar.
a. Operating at frequencies from 40 GHz to 230 GHz and having an average output power exceeding 100 mW;
b. Having a tunable bandwidth exceeding ± 6.25% of the centre operating frequency;
Technical Note:The centre operating frequency equals one half of the sum of the highest plus the lowest specified operating frequencies.
c. Capable of operating simultaneously on more than two carrier frequencies;
d. Capable of operating in synthetic aperture (SAR), inverse synthetic aperture (ISAR) radar mode, or sidelooking airborne (SLAR) radar mode;
e. Incorporating "electronically steerable phased array antennae";
f. Capable of heightfinding non-cooperative targets;
Note 6.A.8.f. does not control precision approach radar (PAR) equipment conforming to ICAO standards.g. Specially designed for airborne (balloon or airframe mounted) operation and having Doppler "signal processing" for the detection of moving targets;
h. Employing processing of radar signals using any of the following:
1. "Radar spread spectrum" techniques; or2. "Radar frequency agility" techniques;
[98]
6.A.8.
i. Providing ground-based operation with a maximum "instrumented range" exceeding 185 km;Note 6.A.8.i. does not control:a. Fishing ground surveillance radar;b. Ground radar equipment specially designed for enroute air traffic control, provided that all the following conditions are met:
1. It has a maximum "instrumented range" of 500 km or less;2. It is configured so that radar target data can be transmitted only one way from the radar site to one or more civil ATC centres;
3. It contains no provisions for remote control of the radar scan rate from the enroute ATC centre; and
4. It is to be permanently installed;
c. Weather balloon tracking radars.
j. Being "laser" radar or Light Detection and Ranging (LIDAR) equipment, having any of the following:
1. "Space-qualified"; or2. Employing coherent heterodyne or homodyne detection techniques and having an angular resolution of less (better) than 20 rad (microradians);
Note 6.A.8.j. does not control LIDAR equipment specially designed for surveying or for meteorological observation.k. Having "signal processing" sub-systems using "pulse compression", with any of the following:
1. A "pulse compression" ratio exceeding 150; or2. A pulse width of less than 200 ns; or
l. Having data processing sub-systems with any of the following:
1. "Automatic target tracking" providing, at any antenna rotation, the predicted target position beyond the time of the next antenna beam passage;Note 6.A.8.l.1. does not control conflict alert capability in ATC systems, or marine or harbour radar.2. Calculation of target velocity from primary radar having non-periodic (variable) scanning rates;
3. Processing for automatic pattern recognition (feature extraction) and comparison with target characteristic data bases (waveforms or imagery) to identify or classify targets; or
4. Superposition and correlation, or fusion, of target data from two or more "geographically dispersed" and "interconnected radar sensors" to enhance and discriminate targets.
Note 6.A.8.l.4. does not control systems, equipment and assemblies used for marine traffic control.
[99]
6.B. TEST, INSPECTION AND PRODUCTION EQUIPMENT
6.B.1. ACCOUSTICS - None
6.B.2. OPTICAL SENSORS - None
6.B.3. CAMERAS - None
6.B.4. OPTICS
Optical equipment, as follows:
a. Equipment for measuring absolute reflectance to an accuracy of ± 0.1% of the reflectance value;b. Equipment other than optical surface scattering measurement equipment, having an unobscured aperture of more than 10 cm, specially designed for the non-contact optical measurement of a non-planar optical surface figure (profile) to an "accuracy" of 2 nm or less (better) against the required profile.
Note: 6.B.4 does not control microscopes.
6.B.5. LASERS None
6.B.6. MAGNETOMETERS - None
6.B.7. GRAVIMETERS
Equipment to produce, align and calibrate land-based gravity meters with a static accuracy of better than 0.1 mgal.
6.B.8 RADAR
Pulse radar cross-section measurement systems having transmit pulse widths of 100 ns or less and specially designed components therefor.
[100]
6.C. MATERIALS
6.C.1. ACOUSTICS - None
6.C.2. OPTICAL SENSORS
Optical sensor materials, as follows:
a. Elemental tellurium (Te) of purity levels of 99.9995% or more;b. Single crystals of cadmium telluride (CdTe), cadmium zinc telluride (CdZnTe) or mercury cadmium telluride (HgCdTe) of any purity level, including epitaxial wafers thereof.
6.C.3. CAMERAS None
6.C.4. OPTICS
Optical materials, as follows:
a. Zinc selenide (ZnSe) and zinc sulphide (ZnS) "substrate blanks" produced by the chemical vapour deposition process, having any of the following:1. A volume greater than 100 cm3; or2. A diameter greater than 80 mm having a thickness of 20 mm or more;
b. Boules of the following electro-optic materials:
1. Potassium titanyl arsenate (KTA);2. Silver gallium selenide (AgGaSe2);
3. Thallium arsenic selenide (Tl3AsSe3, also known as TAS);
c. Non-linear optical materials, having all of the following:
1. Third order susceptibility (chi 3) of 10-6 m2/V2 or more; and2. A response time of less than 1 ms;
d. "Substrate blanks" of silicon carbide or beryllium beryllium (Be/Be) deposited materials exceeding 300 mm in diameter or major axis length;
e. Glass, including fused silica, phosphate glass, fluorophosphate glass, zirconium fluoride (ZrF4) and hafnium fluoride (HfF4), having all of the following:
1. A hydroxyl ion (OH-) concentration of less than 5 ppm;2. Integrated metallic purity levels of less than 1 ppm; and
3. High homogeneity (index of refraction variance) less than 5 x 10-6;
f. Synthetically produced diamond material with an absorption of less than 10-5 cm-1 for wavelengths exceeding 200 nm but not exceeding 14,000 nm.
[101]
6.C.5. LASERS
Synthetic crystalline "laser" host material in unfinished form, as follows:
a. Titanium doped sapphire;b. Alexandrite.
6.C.6. MAGNETOMETERS - None
6.C.7. GRAVIMETERS - None
6.C.8. RADAR - None
6.D. SOFTWARE
6.D.1. "Software" specially designed for the "development" or "production" of equipment specified in 6.A.4., 6.A.5., 6.A.8. or 6.B.8.
6.D.2. "Software" specially designed for the "use" of equipment specified in 6.A.2.b., 6.A.8 or 6.B.8.
6.D.3 Other "software", as follows:
a. ACOUSTICS"Software" as follows:
1. "Software" specially designed for acoustic beam forming for the "real time processing" of acoustic data for passive reception using towed hydrophone arrays;2. "Source code" for the "real time processing" of acoustic data for passive reception using towed hydrophone arrays;
3. "Software" specially designed for bottom or bay cable systems and having beamforming or "source code" for "real time processing" of acoustic data for passive reception;
b. OPTICAL SENSORS - None
c. CAMERAS - None
d. OPTICS - None
e. LASERS - None
[102]
6.D.3.
f. MAGNETOMETERS1. "Software" specially designed for magnetic compensation systems for magnetic sensors designed to operate on mobile platforms;2. "Software" specially designed for magnetic anomaly detection on mobile platforms;
g. GRAVIMETERS
"Software" specially designed to correct motional influences of gravity meters or gravity gradiometers;
h. RADAR
1. Air Traffic Control "software" application "programmes" hosted on general purpose computers located at Air Traffic Control centres and capable of any of the following:a. Processing and displaying more than 150 simultaneous "system tracks"; orb. Accepting radar target data from more than four primary radars;
2. "Software" for the design or "production" of radomes which:
a. Are specially designed to protect the "electronically steerable phased array antennae" specified in 6.A.8.e.; andb. Result in an antenna pattern having an 'average side lobe level' more than 40 dB below the peak of the main beam level.
Technical Note:
'Average side lobe level' in 6.D.3.d.2.b. is measured over the entire array excluding the angular extent of the main beam and the first two side lobes on either side of the main beam.
[103]
6.E. TECHNOLOGY
6.E.1. "Technology" according to the General Technology Note for the "development" of equipment, materials or "software" specified in 6.A., 6.B., 6.C. or 6.D.
6.E.2. "Technology" according to the General Technology Note for the "production" of equipment or materials specified in 6.A., 6.B. or 6.C.
6.E.3. Other "technology", as follows:
a. ACOUTICS - Noneb. OPTICAL SENSORS - None
c. CAMERAS - None
d. OPTICS
"Technology" as follows:
1. Optical surface coating and treatment "technology" "required" to achieve uniformity of 99.5% or better for optical coatings 500 mm or more in diameter or major axis length and with a total loss (absorption and scatter) of less than 5 x 10-3;N.B. See also 2.E.3.f.2. Optical fabrication "technology" using single point diamond turning techniques to produce surface finish accuracies of better than 10 nm rms on non-planar surfaces exceeding 0.5 m2;
e. LASERS
"Technology" "required" for the "development", "production" or "use" of specially designed diagnostic instruments or targets in test facilities for "SHPL" testing or testing or evaluation of materials irradiated by "SHPL" beams;
[104]
6.E.3.
f. MAGNETOMETERS"Technology" "required" for the "development" or "production" of fluxgate "magnetometers" or fluxgate "magnetometer" systems, having any of the following:
1. A "noise level" of less than 0.05 nT rms per square root Hz at frequencies of less than 1 Hz; or2. A "noise level" of less than 1 x 10-3 nT rms per square root Hz at frequencies of 1 Hz or more.
g. GRAVIMETERS - None
h. RADAR - None
Hypertext by JYA/Urban Deadline.